Publication:
A yield-aware modeling methodology for nano-scaled SRAM designs
Date
| dc.contributor.author | Grossar, Evelyn | |
| dc.contributor.author | Croon, Jeroen | |
| dc.contributor.author | Stucchi, Michele | |
| dc.contributor.author | Dehaene, Wim | |
| dc.contributor.author | Maex, Karen | |
| dc.contributor.imecauthor | Stucchi, Michele | |
| dc.contributor.imecauthor | Dehaene, Wim | |
| dc.contributor.imecauthor | Maex, Karen | |
| dc.date.accessioned | 2021-10-16T01:50:58Z | |
| dc.date.available | 2021-10-16T01:50:58Z | |
| dc.date.issued | 2005 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/10531 | |
| dc.source.beginpage | 33 | |
| dc.source.conference | International Conference on Integrated Circuit Design & Technology | |
| dc.source.conferencedate | 9/05/2005 | |
| dc.source.conferencelocation | Austin, TX USA | |
| dc.source.endpage | 36 | |
| dc.title | A yield-aware modeling methodology for nano-scaled SRAM designs | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
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