Publication:

Compact Physics Hot-Carrier Degradation Model Valid over a Wide Bias Range

Date

2023
Journal article
https://doi.org/10.3390/mi14112018
Simple item page Full metadata Statistics
Loading...
Thumbnail Image

Files

Published version 8.58 MB

Author(s)

Tyaginov, Stanislav  
;
Bury, Erik  
;
Grill, Alexander  
;
Yu, Zhuoqing
;
Makarov, Alexander  
;
De Keersgieter, An  
;
Vexler, Mikhail
;
Vandemaele, Michiel  
;
Wang, Runsheng
;
Spessot, Alessio  
;
Vaisman Chasin, Adrian  
;
Kaczer, Ben  

Journal

MICROMACHINES

Abstract

Description

Metrics

Downloads

94 since deposited on 2023-12-31
4last month
3last week
Acq. date: 2025-12-11

Views

935 since deposited on 2023-12-31
Acq. date: 2025-12-11

Citations

Metrics

Downloads

94 since deposited on 2023-12-31
4last month
3last week
Acq. date: 2025-12-11

Views

935 since deposited on 2023-12-31
Acq. date: 2025-12-11

Citations