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Electrical performance comparison of embedded Si1-xGex source/drain junctions processed in 200 mm and 300 mmEpi-reactors
Publication:
Electrical performance comparison of embedded Si1-xGex source/drain junctions processed in 200 mm and 300 mmEpi-reactors
Date
2008
Proceedings Paper
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16818.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Bargallo Gonzalez, Mireia
;
Simoen, Eddy
;
Hikavyy, Andriy
;
Verheyen, Peter
;
Loo, Roger
;
Caymax, Matty
;
Machkaoutsan, Vladimir
;
Tomasini, P.
;
Thomas, S.G.
;
Wise, R.
;
Claeys, Cor
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1947
since deposited on 2021-10-17
Acq. date: 2025-10-23
Citations
Metrics
Views
1947
since deposited on 2021-10-17
Acq. date: 2025-10-23
Citations