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High-k materials for advanced gate stack dielectrics: a comparison of ALCVD and MOCVD as deposition technologies
Publication:
High-k materials for advanced gate stack dielectrics: a comparison of ALCVD and MOCVD as deposition technologies
Date
2003
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Caymax, Matty
;
Bender, Hugo
;
Brijs, Bert
;
Conard, Thierry
;
De Gendt, Stefan
;
Delabie, Annelies
;
Heyns, Marc
;
Onsia, Bart
;
Ragnarsson, Lars-Ake
;
Richard, Olivier
;
Vandervorst, Wilfried
;
Van Elshocht, Sven
;
Zhao, Chao
;
Maes, J.W.
;
Daté, L.
;
Pique, D.
;
Young, E.
;
Tsai, W.
;
Shimamoto, Y.
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2067
since deposited on 2021-10-15
Acq. date: 2025-10-23
Citations
Metrics
Views
2067
since deposited on 2021-10-15
Acq. date: 2025-10-23
Citations