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Test and design-for-test of 3D-stacked ICs
Publication:
Test and design-for-test of 3D-stacked ICs
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Date
2017-12
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Marinissen, Erik Jan
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1761
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Acq. date: 2025-12-17
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Metrics
Views
1761
since deposited on 2021-10-24
1
last month
Acq. date: 2025-12-17
Citations