Publication:
Test and design-for-test of 3D-stacked ICs
Date
| dc.contributor.author | Marinissen, Erik Jan | |
| dc.contributor.imecauthor | Marinissen, Erik Jan | |
| dc.contributor.orcidimec | Marinissen, Erik Jan::0000-0002-5058-8303 | |
| dc.date.accessioned | 2021-10-24T08:46:29Z | |
| dc.date.available | 2021-10-24T08:46:29Z | |
| dc.date.issued | 2017-12 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/28919 | |
| dc.source.conference | Advanced Testing Technology Seminar | |
| dc.source.conferencedate | 13/12/2017 | |
| dc.source.conferencelocation | Nanjing China | |
| dc.title | Test and design-for-test of 3D-stacked ICs | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | ||
| Publication available in collections: |