Publication:

Characterization of a FinFET 6T-SRAM cell by tomography

Date

2009

Meeting abstract

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Author(s)

Richard, Olivier

;

Demuynck, Steven

;

Veloso, Anabela

;

Van Marcke, Patricia

;

Metrics

1859 since deposited on 2021-10-18

Acq. date: 2025-12-15