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Challenges on surface conditioning in 3D device architectures: triple-gate finFETs, gate-all-around lateral and vertical nanowireFETs

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1980 since deposited on 2021-10-24
2last month
Acq. date: 2026-02-24

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1980 since deposited on 2021-10-24
2last month
Acq. date: 2026-02-24

Citations