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Benchmarking of MoS2 FETs with multigate Si-FET options for 5 nm and beyond
Publication:
Benchmarking of MoS2 FETs with multigate Si-FET options for 5 nm and beyond
Date
2015
Journal article
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33364.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Agarwal Kumar, Tarun
;
Yakimets, Dmitry
;
Raghavan, Praveen
;
Radu, Iuliana
;
Thean, Aaron
;
Heyns, Marc
;
Dehaene, Wim
Journal
IEEE Transactions on Electron Devices
Abstract
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2013
since deposited on 2021-10-22
Acq. date: 2025-10-27
Citations
Metrics
Views
2013
since deposited on 2021-10-22
Acq. date: 2025-10-27
Citations