Publication:

Application of focused ion beam for failure analysis

Date

2000
Journal article
Simple item page Full metadata Statistics
Loading...
Thumbnail Image

Author(s)

Bender, Hugo  

Journal

Informacije MIDEM-Journal of Microelectronics Electronic Components and Materials

Abstract

Description

Metrics

Views

1834 since deposited on 2021-10-14
1last month
Acq. date: 2025-12-15

Citations

Metrics

Views

1834 since deposited on 2021-10-14
1last month
Acq. date: 2025-12-15

Citations