Publication:
Application of focused ion beam for failure analysis
Date
| dc.contributor.author | Bender, Hugo | |
| dc.contributor.imecauthor | Bender, Hugo | |
| dc.date.accessioned | 2021-10-14T12:40:44Z | |
| dc.date.available | 2021-10-14T12:40:44Z | |
| dc.date.issued | 2000 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/4112 | |
| dc.source.beginpage | 216 | |
| dc.source.endpage | 222 | |
| dc.source.issue | 4 | |
| dc.source.journal | Informacije MIDEM-Journal of Microelectronics Electronic Components and Materials | |
| dc.source.volume | 30 | |
| dc.title | Application of focused ion beam for failure analysis | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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