Publication:

Assessment of Ge1-xSnx alloys for strained Ge CMOS devices

Date

2010

Meeting abstract

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Files

21497.pdf 20.4 KB

Author(s)

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Vincent, Benjamin

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Clarysse, Trudo

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Demeulemeester, J.

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Vantomme, Andre

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Dekoster, Johan

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Statistics

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Acq. date: 2026-02-27