Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Conference contributions
Assessment of Ge1-xSnx alloys for strained Ge CMOS devices
Publication:
Assessment of Ge1-xSnx alloys for strained Ge CMOS devices
Date
2010
Meeting abstract
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
21497.pdf
20.4 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Takeuchi, S.
;
Shimura, Y.
;
Nishimura, T.
;
Vincent, Benjamin
;
Eneman, Geert
;
Clarysse, Trudo
;
Demeulemeester, J.
;
Temst, K.
;
Vantomme, Andre
;
Dekoster, Johan
;
Caymax, Matty
;
Loo, Roger
;
Nakatsuka, O.
;
Sakai, A.
;
Zaima, S.
Journal
Abstract
Description
Metrics
Views
1967
since deposited on 2021-10-18
Acq. date: 2025-10-23
Citations
Metrics
Views
1967
since deposited on 2021-10-18
Acq. date: 2025-10-23
Citations