Publication:

Assessment of Ge1-xSnx alloys for strained Ge CMOS devices

Date

Loading...
Thumbnail Image

Abstract

Description

Metrics

Views

1970 since deposited on 2021-10-18
2last month
2last week
Acq. date: 2025-12-08

Citations

Metrics

Views

1970 since deposited on 2021-10-18
2last month
2last week
Acq. date: 2025-12-08

Citations