Publication:

Influence of precursor gas on SiGe epitaxial material quality in terms of structural and electrical defects

Date

2015
Proceedings Paper
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dc.contributor.authorIke, Shinichi
dc.contributor.authorSimoen, Eddy
dc.contributor.authorShimura, Yosuke
dc.contributor.authorHikavyy, Andriy
dc.contributor.authorVandervorst, Wilfried
dc.contributor.authorLoo, Roger
dc.contributor.authorTakeuchi, Wakana
dc.contributor.authorNakatsuka, Osamu
dc.contributor.authorZaima, Shigeaki
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorHikavyy, Andriy
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.imecauthorLoo, Roger
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecHikavyy, Andriy::0000-0002-8201-075X
dc.contributor.orcidimecLoo, Roger::0000-0003-3513-6058
dc.date.accessioned2021-10-22T19:49:25Z
dc.date.available2021-10-22T19:49:25Z
dc.date.issued2015
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/25410
dc.identifier.urlhttps://confit.atlas.jp/guide/event/ssdm2015/subject/G-4-4/class?cryptoId=
dc.source.beginpageG4.4
dc.source.conferenceInternational Conference on Solid State Devices and Materials - SSDM
dc.source.conferencedate27/09/2015
dc.source.conferencelocationSapporo Japan
dc.title

Influence of precursor gas on SiGe epitaxial material quality in terms of structural and electrical defects

dc.typeProceedings paper
dspace.entity.typePublication
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