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Alternative double patterning processes: ready for (sub) 32nm hp

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dc.contributor.authorWong, Patrick
dc.contributor.authorMaenhoudt, Mireille
dc.contributor.authorVangoidsenhoven, Diziana
dc.contributor.authorWiaux, Vincent
dc.contributor.imecauthorWong, Patrick
dc.contributor.imecauthorVangoidsenhoven, Diziana
dc.contributor.imecauthorWiaux, Vincent
dc.contributor.orcidimecWong, Patrick::0000-0003-3605-9680
dc.date.accessioned2021-10-18T05:24:11Z
dc.date.available2021-10-18T05:24:11Z
dc.date.embargo9999-12-31
dc.date.issued2009
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/16558
dc.source.conferenceSemicon Europe - Pushing Lithography to the Limits
dc.source.conferencedate6/10/2009
dc.source.conferencelocationDresden Germany
dc.title

Alternative double patterning processes: ready for (sub) 32nm hp

dc.typeProceedings paper
dspace.entity.typePublication
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