Publication:

STT-MRAM Stochastic and Defects-aware DTCO for Last Level Cache at Advanced Process Nodes

Date

2023

Proceedings Paper

https://doi.org/10.1109/ESSDERC59256.2023.10268481

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Author(s)

Garcia-Redondo, F.

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Perumkunnil, Manu

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Van Beek, Simon

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Couet, Sebastien

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Garcia Bardon, Marie

Journal

N/A

Metrics

844 since deposited on 2023-11-24

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Acq. date: 2025-12-15