Publication:

STT-MRAM Stochastic and Defects-aware DTCO for Last Level Cache at Advanced Process Nodes

Date

2023
Proceedings Paper
https://doi.org/10.1109/ESSDERC59256.2023.10268481
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Author(s)

Garcia-Redondo, F.
;
Rao, Siddharth  
;
Gupta, Mohit  
;
Perumkunnil, Manu  
;
Xiang, Yang  
;
Abdi, Dawit  
;
Van Beek, Simon  
;
Couet, Sebastien  
;
Garcia Bardon, Marie  

Journal

N/A

Abstract

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848 since deposited on 2023-11-24
Acq. date: 2026-02-24

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848 since deposited on 2023-11-24
Acq. date: 2026-02-24

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