Publication:
STT-MRAM Stochastic and Defects-aware DTCO for Last Level Cache at Advanced Process Nodes
| dc.contributor.author | Garcia-Redondo, F. | |
| dc.contributor.author | Rao, Siddharth | |
| dc.contributor.author | Gupta, Mohit | |
| dc.contributor.author | Perumkunnil, Manu | |
| dc.contributor.author | Xiang, Yang | |
| dc.contributor.author | Abdi, Dawit | |
| dc.contributor.author | Van Beek, Simon | |
| dc.contributor.author | Couet, Sebastien | |
| dc.contributor.author | Garcia Bardon, Marie | |
| dc.contributor.imecauthor | Rao, Siddharth | |
| dc.contributor.imecauthor | Gupta, Mohit | |
| dc.contributor.imecauthor | Perumkunnil, Manu | |
| dc.contributor.imecauthor | Xiang, Yang | |
| dc.contributor.imecauthor | Abdi, Dawit | |
| dc.contributor.imecauthor | Van Beek, Simon | |
| dc.contributor.imecauthor | Couet, Sebastien | |
| dc.contributor.imecauthor | Garcia Bardon, Marie | |
| dc.contributor.orcidimec | Rao, Siddharth::0000-0001-6161-3052 | |
| dc.contributor.orcidimec | Gupta, Mohit::0000-0002-1924-1264 | |
| dc.contributor.orcidimec | Perumkunnil, Manu::0000-0002-0029-6548 | |
| dc.contributor.orcidimec | Xiang, Yang::0000-0003-0091-6935 | |
| dc.contributor.orcidimec | Abdi, Dawit::0000-0002-3598-8798 | |
| dc.contributor.orcidimec | Van Beek, Simon::0000-0002-2499-4172 | |
| dc.contributor.orcidimec | Couet, Sebastien::0000-0001-6436-9593 | |
| dc.contributor.orcidimec | Garcia Bardon, Marie::0000-0001-5772-5406 | |
| dc.date.accessioned | 2024-05-06T14:52:43Z | |
| dc.date.available | 2023-11-24T17:33:10Z | |
| dc.date.available | 2024-05-06T14:52:43Z | |
| dc.date.issued | 2023 | |
| dc.identifier.doi | 10.1109/ESSDERC59256.2023.10268481 | |
| dc.identifier.eisbn | 979-8-3503-0423-7 | |
| dc.identifier.issn | 1930-8876 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/43178 | |
| dc.publisher | IEEE | |
| dc.source.beginpage | 97 | |
| dc.source.conference | IEEE 53rd European Solid-State Device Research Conference (ESSDERC) | |
| dc.source.conferencedate | SEP 11-14, 2023 | |
| dc.source.conferencelocation | Lisbon | |
| dc.source.endpage | 100 | |
| dc.source.journal | N/A | |
| dc.source.numberofpages | 4 | |
| dc.title | STT-MRAM Stochastic and Defects-aware DTCO for Last Level Cache at Advanced Process Nodes | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
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