Publication:

Charge trapping, mobility degradation and reliability of high-e gate stacks

Date

2002
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Author(s)

Cartier, Eduard
;
Kerber, Andreas
;
Pantisano, Luigi
;
Carter, Richard
;
Kauerauf, Thomas
;
Degraeve, Robin  

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1948 since deposited on 2021-10-14
Acq. date: 2026-01-25

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1948 since deposited on 2021-10-14
Acq. date: 2026-01-25

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