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Particle removal efficiency and damage analysis on silicon wafers after megasonic cleaning in solvents
Publication:
Particle removal efficiency and damage analysis on silicon wafers after megasonic cleaning in solvents
Date
2009
Journal article
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18196.pdf
940.45 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Barbagini, Francesca
;
Halder, Sandip
;
Janssens, Tom
;
Kenis, Karine
;
Wostyn, Kurt
;
Bearda, Twan
;
Le, Quoc Toan
;
Leunissen, Peter
;
Mertens, Paul
;
Kim, Kyung Hyun
;
Andreas, Michael
Journal
Journal of Adhesion Science and Technology
Abstract
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2011
since deposited on 2021-10-17
Acq. date: 2025-10-23
Citations
Metrics
Views
2011
since deposited on 2021-10-17
Acq. date: 2025-10-23
Citations