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Detailed low frequency noise assessment on GAA NW n-channel FETs

 
dc.contributor.authorCretu, B.
dc.contributor.authorBordin, A.
dc.contributor.authorClaeys, C.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorHellings, Geert
dc.contributor.authorLinten, Dimitri
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorHellings, Geert
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecHellings, Geert::0000-0002-5376-2119
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.date.accessioned2022-03-02T15:28:12Z
dc.date.available2022-03-02T15:28:12Z
dc.date.embargo2023-08-31
dc.date.issued2021
dc.identifier.doi10.1016/j.sse.2021.108029
dc.identifier.issn0038-1101
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/39253
dc.publisherPERGAMON-ELSEVIER SCIENCE LTD
dc.source.beginpage108029
dc.source.issuena
dc.source.journalSOLID-STATE ELECTRONICS
dc.source.numberofpages5
dc.source.volume181
dc.subject.keywordsSPECTROSCOPY
dc.title

Detailed low frequency noise assessment on GAA NW n-channel FETs

dc.typeJournal article
dspace.entity.typePublication
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