Publication:

MEMS capacitive series switches: optimal test vehicles for the RF self-biasing phenomenon

Date

2005-01

Proceedings Paper

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Author(s)

Rottenberg, Xavier

;

Vaesen, Kristof

;

Brebels, Steven

;

Nauwelaers, Bart

;

Mertens, Robert

;

De Raedt, Walter

;

Tilmans, Harrie

Metrics

1778 since deposited on 2021-10-16

Acq. date: 2025-12-15