Publication:

MEMS capacitive series switches: optimal test vehicles for the RF self-biasing phenomenon

Date

2005-01
Proceedings Paper
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dc.contributor.authorRottenberg, Xavier
dc.contributor.authorVaesen, Kristof
dc.contributor.authorBrebels, Steven
dc.contributor.authorNauwelaers, Bart
dc.contributor.authorMertens, Robert
dc.contributor.authorDe Raedt, Walter
dc.contributor.authorTilmans, Harrie
dc.contributor.imecauthorRottenberg, Xavier
dc.contributor.imecauthorVaesen, Kristof
dc.contributor.imecauthorBrebels, Steven
dc.contributor.imecauthorNauwelaers, Bart
dc.contributor.imecauthorMertens, Robert
dc.contributor.imecauthorDe Raedt, Walter
dc.contributor.imecauthorTilmans, Harrie
dc.contributor.orcidimecVaesen, Kristof::0000-0001-9971-3593
dc.contributor.orcidimecBrebels, Steven::0000-0002-1568-0286
dc.contributor.orcidimecDe Raedt, Walter::0000-0002-7117-7976
dc.contributor.orcidimecTilmans, Harrie::0000-0003-4240-4962
dc.date.accessioned2021-10-16T04:41:45Z
dc.date.available2021-10-16T04:41:45Z
dc.date.issued2005-01
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/11138
dc.source.beginpage147
dc.source.conferenceProceedings of the 18th IEEE International Conference on Micro Electro Mechanical Systems - MEMS
dc.source.conferencedate30/01/2005
dc.source.conferencelocationMiami, FL USA
dc.source.endpage150
dc.title

MEMS capacitive series switches: optimal test vehicles for the RF self-biasing phenomenon

dc.typeProceedings paper
dspace.entity.typePublication
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