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Conference contributions
Evaluation of the accuracy and precision of STEM and EDS metrology on horizontal GAA nanowire devices
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Evaluation of the accuracy and precision of STEM and EDS metrology on horizontal GAA nanowire devices
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Date
2019
Proceedings Paper
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41315.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Johanesen, Hayley
;
Strauss, Michael
;
Kenslea, Anne
;
Hakala, Chris
;
Kwakman, Laurens
;
Boullart, Werner
;
Mertens, Hans
;
Siew, Yong Kong
;
Barla, Kathy
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1920
since deposited on 2021-10-27
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Acq. date: 2025-12-15
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Metrics
Views
1920
since deposited on 2021-10-27
2
last month
Acq. date: 2025-12-15
Citations