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Grown-in and process-induced defect control in advanced Ge technologies
Publication:
Grown-in and process-induced defect control in advanced Ge technologies
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Date
2007
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Claeys, Cor
;
Simoen, Eddy
Journal
Abstract
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1822
since deposited on 2021-10-16
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last month
Acq. date: 2025-12-15
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Metrics
Views
1822
since deposited on 2021-10-16
1
last month
Acq. date: 2025-12-15
Citations