Publication:
Negative bias temperature instabilities in SiGe-pMOSFETs with SiO2/HfO2 gate dielectrics
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1956 since deposited on 2021-10-21
1last month
Acq. date: 2025-12-08
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Metrics
Views
1956 since deposited on 2021-10-21
1last month
Acq. date: 2025-12-08
Citations