Publication:
Negative bias temperature instabilities in SiGe-pMOSFETs with SiO2/HfO2 gate dielectrics
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1960 since deposited on 2021-10-21
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Acq. date: 2026-01-26
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Statistics
Views
1960 since deposited on 2021-10-21
4last month
1last week
Acq. date: 2026-01-26
Citations