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Optical constants for EUV scatterometry
Publication:
Optical constants for EUV scatterometry
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Date
2021
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Ciesielski, Richard
;
Saadeh, Qais
;
Naujok, Philipp
;
Opsomer, Karl
;
Soulie, Jean-Philippe
;
Wu, Meiyi
;
Philipsen, Vicky
;
Van de Kruijs, Robbert
;
Kolbe, Michael
;
Scholze, Frank
;
Soltwisch, Victor
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1937
since deposited on 2021-10-31
1
last month
Acq. date: 2025-12-10
Citations
Metrics
Views
1937
since deposited on 2021-10-31
1
last month
Acq. date: 2025-12-10
Citations