High FET performance for a future CMOS GeO2-based technology

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Author(s)

Bellenger, Florence

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De Jaeger, Brice

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Merckling, Clement

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Hoffmann, Thomas Y.

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De Meyer, Kristin

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Journal

IEEE Electron Device Letters

Metrics

1987 since deposited on 2021-10-18

Acq. date: 2025-10-23