Publication:

Wafer-Scale Electrical Characterization of Silicon Quantum Dots from Room to Low Temperatures

Date

2023
Proceedings Paper
https://doi.org/10.1109/itc51656.2023.00031
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Published version 15.39 MB

Author(s)

Lorenzelli, Francesco  
;
Elsayed, Asser  
;
Godfrin, Clement  
;
Grill, Alexander  
;
Kubicek, Stefan  
;
Li, Roy  
;
Stucchi, Michele  
;
Wan, Danny  
;
De Greve, Kristiaan  
;
Marinissen, Erik Jan  
;
Gielen, Georges  

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N/A

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