Publication:

Wafer-Scale Electrical Characterization of Silicon Quantum Dots from Room to Low Temperatures

Date

2023-12-22

Proceedings Paper

https://doi.org/10.1109/ITC51656.2023.00031

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Files

Published version 15.39 MB

Author(s)

Lorenzelli, Francesco

;

;

Godfrin, Clement

;

Grill, Alexander

;

Kubicek, Stefan

;

;

Stucchi, Michele

;

;

De Greve, Kristiaan

;

Marinissen, Erik Jan

;

Gielen, Georges

Journal

N/A

Statistics

530 since deposited on 2024-09-18

Acq. date: 2026-03-16