Publication:

Wafer-Scale Electrical Characterization of Silicon Quantum Dots from Room to Low Temperatures

Date

2023-12-22
Proceedings Paper
https://doi.org/10.1109/ITC51656.2023.00031
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dc.contributor.authorLorenzelli, Francesco
dc.contributor.authorElsayed, Asser
dc.contributor.authorGodfrin, Clement
dc.contributor.authorGrill, Alexander
dc.contributor.authorKubicek, Stefan
dc.contributor.authorLi, Roy
dc.contributor.authorStucchi, Michele
dc.contributor.authorWan, Danny
dc.contributor.authorDe Greve, Kristiaan
dc.contributor.authorMarinissen, Erik Jan
dc.contributor.authorGielen, Georges
dc.contributor.imecauthorLorenzelli, Francesco
dc.contributor.imecauthorElsayed, Asser
dc.contributor.imecauthorGodfrin, Clement
dc.contributor.imecauthorGrill, Alexander
dc.contributor.imecauthorKubicek, Stefan
dc.contributor.imecauthorLi, Roy
dc.contributor.imecauthorStucchi, Michele
dc.contributor.imecauthorWan, Danny
dc.contributor.imecauthorDe Greve, Kristiaan
dc.contributor.imecauthorMarinissen, Erik Jan
dc.contributor.imecauthorGielen, Georges
dc.contributor.orcidexthttps://orcid.org/0000-0002-4061-9428
dc.contributor.orcidimecGodfrin, Clement::0000-0002-5244-3474
dc.contributor.orcidimecLorenzelli, Francesco::0000-0001-6465-7157
dc.contributor.orcidimecElsayed, Asser::0000-0002-5264-5682
dc.contributor.orcidimecGrill, Alexander::0000-0003-1615-1033
dc.contributor.orcidimecKubicek, Stefan::0009-0006-2163-5760
dc.contributor.orcidimecLi, Roy::0000-0002-2145-7590
dc.contributor.orcidimecStucchi, Michele::0000-0002-7848-0492
dc.contributor.orcidimecWan, Danny::0000-0003-4847-3184
dc.contributor.orcidimecDe Greve, Kristiaan::0000-0002-1314-9715
dc.contributor.orcidimecMarinissen, Erik Jan::0000-0002-5058-8303
dc.date.accessioned2024-11-04T10:48:47Z
dc.date.available2024-09-18T12:00:12Z
dc.date.available2024-11-04T10:48:47Z
dc.date.embargo9999-12-31
dc.date.issued2023-12-22
dc.identifier.doi10.1109/ITC51656.2023.00031
dc.identifier.issn2378-2250
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/44517
dc.source.conference2023 IEEE International Test Conference (ITC)
dc.source.conferencedate07-15 October 2023
dc.source.conferencelocationAnaheim, CA, USA
dc.source.journalN/A
dc.source.numberofpages6
dc.subject.disciplineElectrical & electronic engineering
dc.title

Wafer-Scale Electrical Characterization of Silicon Quantum Dots from Room to Low Temperatures

dc.typeProceedings paper
dspace.entity.typePublication
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