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Stresses in strained GeSi stripes and quantum structures: calculation using the finite element method and determination using micro-Raman and other measurements
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Stresses in strained GeSi stripes and quantum structures: calculation using the finite element method and determination using micro-Raman and other measurements
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Date
1997
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Jain, Suresh
;
Maes, Herman
;
Pinardi, Kuntjoro
Journal
Thin Solid Films
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1955
since deposited on 2021-09-30
2
last month
Acq. date: 2025-12-09
Citations
Metrics
Views
1955
since deposited on 2021-09-30
2
last month
Acq. date: 2025-12-09
Citations