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Stresses in strained GeSi stripes and quantum structures: calculation using the finite element method and determination using micro-Raman and other measurements

Date

1997
Journal article
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dc.contributor.authorJain, Suresh
dc.contributor.authorMaes, Herman
dc.contributor.authorPinardi, Kuntjoro
dc.date.accessioned2021-09-30T08:28:35Z
dc.date.available2021-09-30T08:28:35Z
dc.date.embargo9999-12-31
dc.date.issued1997
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1944
dc.source.beginpage218
dc.source.endpage226
dc.source.issue1_2
dc.source.journalThin Solid Films
dc.source.volume292
dc.title

Stresses in strained GeSi stripes and quantum structures: calculation using the finite element method and determination using micro-Raman and other measurements

dc.typeJournal article
dspace.entity.typePublication
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