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Articles
Impact of Solder Voids on IGBT Thermal Behavior: A Multi-Methodological Approach
Publication:
Impact of Solder Voids on IGBT Thermal Behavior: A Multi-Methodological Approach
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Date
2024
Journal article
https://doi.org/10.3390/electronics13112188
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Alavi, Omid
;
De Ceuninck, Ward
;
Daenen, Michaël
Journal
ELECTRONICS
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Downloads
411
since deposited on 2024-06-23
2
last month
Acq. date: 2026-02-27
Views
504
since deposited on 2024-06-23
1
last month
Acq. date: 2026-02-27
Citations