Publication:
Impact of probe-to-pad contact degradation on the high-frequency charateristics of RF MOSFETs and guidelines to avoid it
Date
| dc.contributor.author | Vandamme, Ewout | |
| dc.contributor.author | Schreurs, Dominique | |
| dc.contributor.author | Van Dinther, G. | |
| dc.contributor.imecauthor | Schreurs, Dominique | |
| dc.date.accessioned | 2021-10-14T18:09:01Z | |
| dc.date.available | 2021-10-14T18:09:01Z | |
| dc.date.issued | 2001 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/5760 | |
| dc.source.beginpage | 114 | |
| dc.source.endpage | 120 | |
| dc.source.issue | 3 | |
| dc.source.journal | International Journal of RF and Microwave Computer-Aided-Engineering | |
| dc.source.volume | 11 | |
| dc.title | Impact of probe-to-pad contact degradation on the high-frequency charateristics of RF MOSFETs and guidelines to avoid it | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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