Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Conference contributions
Extraction of the interface and oxide charge density in silicon-on-insulator MOSFETs
Publication:
Extraction of the interface and oxide charge density in silicon-on-insulator MOSFETs
Copy permalink
Date
1996
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
1458.pdf
270.64 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Simoen, Eddy
;
Claeys, Cor
;
Lukyanchikova, N.
;
Petrichuk, M.
;
Garbar, N.
;
Martino, Joao Antonio
;
Sonnenberg, V.
Journal
Abstract
Description
Metrics
Views
1976
since deposited on 2021-09-29
Acq. date: 2025-12-11
Citations
Metrics
Views
1976
since deposited on 2021-09-29
Acq. date: 2025-12-11
Citations