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Evaluation of Ta-Co alloys as novel high-k extreme ultraviolet mask absorber

 
dc.contributor.authorThakare, Devesh
dc.contributor.authorWu, Meiyi
dc.contributor.authorOpsomer, Karl
dc.contributor.authorSaadeh, Qais
dc.contributor.authorSoltwisch, Victor
dc.contributor.authorNaujok, Philipp
dc.contributor.authorDetavernier, Christophe
dc.contributor.authorDattilo, Davide
dc.contributor.authorFoltin, Markus
dc.contributor.authorGoodyear, Andy
dc.contributor.authorCooke, Mike
dc.contributor.authorDelabie, Annelies
dc.contributor.authorPhilipsen, Vicky
dc.contributor.imecauthorThakare, Devesh
dc.contributor.imecauthorWu, Meiyi
dc.contributor.imecauthorOpsomer, Karl
dc.contributor.imecauthorDelabie, Annelies
dc.contributor.imecauthorPhilipsen, Vicky
dc.contributor.orcidimecThakare, Devesh::0000-0003-3265-7042
dc.contributor.orcidimecDelabie, Annelies::0000-0001-9739-7419
dc.contributor.orcidimecPhilipsen, Vicky::0000-0002-2959-432X
dc.date.accessioned2024-03-12T09:50:42Z
dc.date.available2023-08-27T17:28:50Z
dc.date.available2024-03-12T09:50:42Z
dc.date.issued2023
dc.description.wosFundingTextThe authors acknowledge that this project has received funding from the Electronic Component Systems for European Leadership Joint Undertaking (Grant No.& nbsp;783247 - TAPES3) (Technology Advances for Pilot line of Enhanced Semiconductors for 3 & nbsp;nm). This Joint Undertaking receives support from the European Union's Horizon 2020 research and innovation program alongside the Netherlands, Belgium, Germany, France, Austria, United Kingdom, Israel, and Switzerland. The authors would like to thank the Materials and Component Analysis (MCA) department at imec for material characterizations and Ivan Pollentier (imec) for hydrogen stability experiments. Finally, we thank Synopsys for supporting us with the S-Litho EUV simulation tool. The authors have no conflicts of interest to declare.
dc.identifier.doi10.1117/1.JMM.22.2.024403
dc.identifier.issn1932-5150
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/42412
dc.publisherSPIE-SOC PHOTO-OPTICAL INSTRUMENTATION ENGINEERS
dc.source.beginpageArt. 024403
dc.source.endpageN/A
dc.source.issue2
dc.source.journalJOURNAL OF MICRO-NANOPATTERNING MATERIALS AND METROLOGY-JM3
dc.source.numberofpages23
dc.source.volume22
dc.subject.keywordsREFLECTION
dc.subject.keywordsSURFACE
dc.title

Evaluation of Ta-Co alloys as novel high-k extreme ultraviolet mask absorber

dc.typeJournal article
dspace.entity.typePublication
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