Publication:

Trapping of Hot Carriers in the Forksheet FET Wall: A TCAD Study

Date

2023
Journal article
https://doi.org/10.1109/led.2022.3229763
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Published version 9.79 MB
Accepted version 3.54 MB

Author(s)

Vandemaele, Michiel  
;
Kaczer, Ben  
;
Tyaginov, Stanislav  
;
Franco, Jacopo  
;
Bury, Erik  
;
Vaisman Chasin, Adrian  
;
Makarov, Alexander  
;
Hellings, Geert  
;
Groeseneken, Guido  

Journal

IEEE ELECTRON DEVICE LETTERS

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475 since deposited on 2023-04-30
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1241 since deposited on 2023-04-30
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