Publication:

Trapping of Hot Carriers in the Forksheet FET Wall: A TCAD Study

Date

2023
Journal article
https://doi.org/10.1109/LED.2022.3229763
Simple item page Full metadata Statistics
 
dc.contributor.authorVandemaele, Michiel
dc.contributor.authorKaczer, Ben
dc.contributor.authorTyaginov, Stanislav
dc.contributor.authorFranco, Jacopo
dc.contributor.authorBury, Erik
dc.contributor.authorVaisman Chasin, Adrian
dc.contributor.authorMakarov, Alexander
dc.contributor.authorHellings, Geert
dc.contributor.authorGroeseneken, Guido
dc.contributor.imecauthorVandemaele, Michiel
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorTyaginov, Stanislav
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorBury, Erik
dc.contributor.imecauthorVaisman Chasin, Adrian
dc.contributor.imecauthorMakarov, Alexander
dc.contributor.imecauthorHellings, Geert
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecVandemaele, Michiel::0000-0003-0740-4115
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecBury, Erik::0000-0002-5847-3949
dc.contributor.orcidimecVaisman Chasin, Adrian::0000-0002-9940-0260
dc.contributor.orcidimecMakarov, Alexander::0000-0002-9927-6511
dc.contributor.orcidimecHellings, Geert::0000-0002-5376-2119
dc.contributor.orcidimecGroeseneken, Guido::0000-0003-3763-2098
dc.contributor.orcidimecTyaginov, Stanislav::0000-0002-5348-2096
dc.date.accessioned2023-06-29T09:54:16Z
dc.date.available2023-04-30T04:07:24Z
dc.date.available2023-06-29T09:54:16Z
dc.date.embargo2023-02-01
dc.date.issued2023
dc.description.wosFundingTextThe work of M. Vandemaele was supported by the Ph.D. Fellowship of the Research Foundation Flanders (Belgium) under Grant 11A3621N. The review of this letter was arranged by Editor S. Hall. (Corresponding author: M. Vandemaele.)
dc.identifier.doi10.1109/LED.2022.3229763
dc.identifier.issn0741-3106
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/41512
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
dc.source.beginpage197
dc.source.endpage200
dc.source.issue2
dc.source.journalIEEE ELECTRON DEVICE LETTERS
dc.source.numberofpages4
dc.source.volume44
dc.title

Trapping of Hot Carriers in the Forksheet FET Wall: A TCAD Study

dc.typeJournal article
dspace.entity.typePublication
Files

Original bundle

Name:
Trapping_of_Hot_Carriers_in_the_Forksheet_FET_Wall_A_TCAD_Study.pdf
Size:
9.79 MB
Format:
Adobe Portable Document Format
Description:
Published version
Download
Name:
2022_Vandemaele_EDL.pdf
Size:
3.54 MB
Format:
Adobe Portable Document Format
Description:
Accepted version
Download
Publication available in collections:
Articles