Publication:

A new quantitative model to predict SILC-related disturb characteristics in Flash E2PROM devices

Date

1996

Proceedings Paper

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Files

1127.pdf 348.38 KB

Author(s)

;

;

Wellekens, Dirk

;

Degraeve, Robin

;

Roussel, Philippe

;

Haspeslagh, Luc

;

;

Groeseneken, Guido

;

Statistics

1995 since deposited on 2021-09-29

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Acq. date: 2026-03-17