Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Conference contributions
A new quantitative model to predict SILC-related disturb characteristics in Flash E2PROM devices
Publication:
A new quantitative model to predict SILC-related disturb characteristics in Flash E2PROM devices
Copy permalink
Date
1996
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
1127.pdf
348.38 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
De Blauwe, Jan
;
Van Houdt, Jan
;
Wellekens, Dirk
;
Degraeve, Robin
;
Roussel, Philippe
;
Haspeslagh, Luc
;
Deferm, Ludo
;
Groeseneken, Guido
;
Maes, Herman
Journal
Abstract
Description
Metrics
Views
1992
since deposited on 2021-09-29
4
last month
Acq. date: 2025-12-12
Citations
Metrics
Views
1992
since deposited on 2021-09-29
4
last month
Acq. date: 2025-12-12
Citations