Publication:
Measurement of hole transport in ultrathin SiGe layers and their application in 2D device simulations of heterojunction pMOSFETs
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1900 since deposited on 2021-10-14
3last month
Acq. date: 2026-01-26
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Statistics
Views
1900 since deposited on 2021-10-14
3last month
Acq. date: 2026-01-26
Citations