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Intercomparison of 2-D carrier profiles in MOSFET structures obtaind with scanning resistance microscopy and inverse modeling
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1913 since deposited on 2021-10-06
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Acq. date: 2026-02-24
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1913 since deposited on 2021-10-06
1last month
1last week
Acq. date: 2026-02-24
Citations