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RTS Noise Characterization of Trap Properties in InGaAs nFinFETs
Publication:
RTS Noise Characterization of Trap Properties in InGaAs nFinFETs
Date
2023
Journal article
https://doi.org/10.1109/TED.2023.3278612
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Xiao, Xiaolei
;
He, Liang
;
Chen, Hua
;
Wang, Xianyu
;
Simoen, Eddy
;
Claeys, Cor
Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
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931
since deposited on 2023-07-16
Acq. date: 2025-10-25
Citations
Metrics
Views
931
since deposited on 2023-07-16
Acq. date: 2025-10-25
Citations