Publication:
Simulation and measurement of multiplication in thin film electroluminescent devices with doped probe layers
Date
| dc.contributor.author | Neyts, K. | |
| dc.contributor.author | Corlatan, D. | |
| dc.date.accessioned | 2021-10-01T08:33:13Z | |
| dc.date.available | 2021-10-01T08:33:13Z | |
| dc.date.issued | 1998 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/2801 | |
| dc.source.beginpage | 768 | |
| dc.source.endpage | 777 | |
| dc.source.journal | IEEE Trans. Electron Devices | |
| dc.source.volume | 45 | |
| dc.title | Simulation and measurement of multiplication in thin film electroluminescent devices with doped probe layers | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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