Publication:
D.C. and low frequency noise characteristics of g-irradiated gate-all-around silicon-on-insulator MOS transistors
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2070 since deposited on 2021-09-29
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Acq. date: 2026-01-06
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2070 since deposited on 2021-09-29
1last month
1last week
Acq. date: 2026-01-06
Citations