Publication:
Printing the contact and metal layers for the 32 and 22 nm node: comparing positive and negative development process
Date
| dc.contributor.author | Bekaert, Joost | |
| dc.contributor.author | Van Look, Lieve | |
| dc.contributor.author | Wiaux, Vincent | |
| dc.contributor.author | Truffert, Vincent | |
| dc.contributor.author | Maenhoudt, Mireille | |
| dc.contributor.author | Vandenberghe, Geert | |
| dc.contributor.author | Reybrouck, Mario | |
| dc.contributor.author | Tarutani, S. | |
| dc.contributor.imecauthor | Bekaert, Joost | |
| dc.contributor.imecauthor | Van Look, Lieve | |
| dc.contributor.imecauthor | Wiaux, Vincent | |
| dc.contributor.imecauthor | Truffert, Vincent | |
| dc.contributor.imecauthor | Vandenberghe, Geert | |
| dc.contributor.imecauthor | Reybrouck, Mario | |
| dc.contributor.orcidimec | Bekaert, Joost::0000-0003-3075-3479 | |
| dc.contributor.orcidimec | Truffert, Vincent::0000-0001-7851-830X | |
| dc.date.accessioned | 2021-10-17T21:21:28Z | |
| dc.date.available | 2021-10-17T21:21:28Z | |
| dc.date.embargo | 9999-12-31 | |
| dc.date.issued | 2009 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/14967 | |
| dc.source.conference | 6th International Symposium on Immersion Lithography Extensions | |
| dc.source.conferencedate | 22/10/2009 | |
| dc.source.conferencelocation | Prague Czech Republic | |
| dc.title | Printing the contact and metal layers for the 32 and 22 nm node: comparing positive and negative development process | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | Original bundle
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| Publication available in collections: |