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Measurement and simulation of boron diffusivity in strained Si1-xGex epitaxial layers
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Measurement and simulation of boron diffusivity in strained Si1-xGex epitaxial layers
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Date
2000
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Krishnasamy, Rajendran
;
Schoenmaker, Wim
Journal
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1998
since deposited on 2021-10-14
Acq. date: 2026-01-11
Citations
Metrics
Views
1998
since deposited on 2021-10-14
Acq. date: 2026-01-11
Citations