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Analytic variability study of inference accuracy in RRAM arrays with a binary tree winner-take-all circuit for neuromorphic applications
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Analytic variability study of inference accuracy in RRAM arrays with a binary tree winner-take-all circuit for neuromorphic applications
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Date
2018
Proceedings Paper
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38619.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Doevenspeck, Jonas
;
Degraeve, Robin
;
Cosemans, Stefan
;
Roussel, Philippe
;
Verhoef, Bram
;
Lauwereins, Rudy
;
Dehaene, Wim
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1917
since deposited on 2021-10-25
Acq. date: 2025-12-12
Citations
Metrics
Views
1917
since deposited on 2021-10-25
Acq. date: 2025-12-12
Citations