Publication:

Low frequency noise analysis and modeling in vertical tunnel FETs with Ge Source

Date

2016

Journal article

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Author(s)

;

Agopian, Paula G. D.

;

Martino, Joao A.

;

;

Rooyackers, Rita

;

Vandooren, Anne

;

;

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Journal

IEEE Transactions on Electron Devices

Statistics

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Acq. date: 2026-02-27