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Low frequency noise analysis and modeling in vertical tunnel FETs with Ge Source
Publication:
Low frequency noise analysis and modeling in vertical tunnel FETs with Ge Source
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Date
2016
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Neves, Felipe
;
Agopian, Paula G. D.
;
Martino, Joao A.
;
Cretu, Bogdan
;
Rooyackers, Rita
;
Vandooren, Anne
;
Simoen, Eddy
;
Thean, Aaron
;
Claeys, Cor
Journal
IEEE Transactions on Electron Devices
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1951
since deposited on 2021-10-23
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Acq. date: 2026-01-09
Citations
Metrics
Views
1951
since deposited on 2021-10-23
2
last month
1
last week
Acq. date: 2026-01-09
Citations