Publication:

Low frequency noise analysis and modeling in vertical tunnel FETs with Ge Source

Date

2016
Journal article
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dc.contributor.authorNeves, Felipe
dc.contributor.authorAgopian, Paula G. D.
dc.contributor.authorMartino, Joao A.
dc.contributor.authorCretu, Bogdan
dc.contributor.authorRooyackers, Rita
dc.contributor.authorVandooren, Anne
dc.contributor.authorSimoen, Eddy
dc.contributor.authorThean, Aaron
dc.contributor.authorClaeys, Cor
dc.contributor.imecauthorVandooren, Anne
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorThean, Aaron
dc.contributor.orcidimecVandooren, Anne::0000-0002-2412-0176
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.accessioned2021-10-23T13:14:39Z
dc.date.available2021-10-23T13:14:39Z
dc.date.issued2016
dc.identifier.issn0018-9383
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/27074
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7428915
dc.source.beginpage1658
dc.source.endpage1665
dc.source.issue4
dc.source.journalIEEE Transactions on Electron Devices
dc.source.volume63
dc.title

Low frequency noise analysis and modeling in vertical tunnel FETs with Ge Source

dc.typeJournal article
dspace.entity.typePublication
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