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Articles
Oxygen chemiluminescence in He plasma as a method for plasma damage evaluation of Low-k dielectrics
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Oxygen chemiluminescence in He plasma as a method for plasma damage evaluation of Low-k dielectrics
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Date
2008
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Urbanowicz, Adam
;
Shamiryan, Denis
;
Baklanov, Mikhaïl
;
De Gendt, Stefan
Journal
Microelectronic Engineering
Abstract
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1940
since deposited on 2021-10-17
Acq. date: 2026-01-07
Citations
Metrics
Views
1940
since deposited on 2021-10-17
Acq. date: 2026-01-07
Citations