Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Conference contributions
FUSI specific yield monitoring enabling improved circuit performance and fast feedback to production
Publication:
FUSI specific yield monitoring enabling improved circuit performance and fast feedback to production
Copy permalink
Date
2007
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Chiarella, Thomas
;
Rosmeulen, Maarten
;
Tigelaar, Howard
;
Kerner, Christoph
;
Nackaerts, Axel
;
Ramos, Javier
;
Lauwers, Anne
;
Veloso, Anabela
;
Jurczak, Gosia
;
Rothschild, Aude
;
Witters, Liesbeth
;
Yu, HongYu
;
Kittl, Jorge
;
Verbeeck, Rita
;
de Potter de ten Broeck, Muriel
;
Debusschere, Ingrid
;
Absil, Philippe
;
Biesemans, Serge
;
Hoffmann, Thomas Y.
Journal
Abstract
Description
Statistics
Views
2050
since deposited on 2021-10-16
Acq. date: 2026-07-17
Citations
Statistics
Views
2050
since deposited on 2021-10-16
Acq. date: 2026-07-17
Citations