Publication:
High-Temperature PBTI in Trench-Gate Vertical GaN Power MOSFETs: Role of Border and Semiconductor Traps
Loading...
Journal
Abstract
Description
Metrics
Views
778 since deposited on 2023-07-15
Acq. date: 2025-10-23
Citations
Metrics
Views
778 since deposited on 2023-07-15
Acq. date: 2025-10-23
Citations